Efficient aging test and burn-in sockets for mass production lines or repair centers for electronic devices - This aging test and burn-in socket is tailored for tests and screening of 3P and TO247 5L components, making it suitable for high-volume workflows. Improves longevity and functionality with easy-to-use TO3P TO247 5L aging test sockets - Designed as a practical tool for any electronics development lab, these sockets help assess and enhance the long-term performance of electronic devices. High temperature capability with 10A current capacity - Built to handle high temperature environments and a 10A current, suitable for devices ranging from low to high power. Stable performance with gold-plated TO3P TO247 5L AGING TEST SATILEN sockets - Gold-plated construction provides strong antioxidation properties for electronic components, ensuring reliable, consistent operation. Typical use scenarios - In a mass production facility or repair center, screen and test 3P and TO247 5L components efficiently during assembly or service workflows. - In an electronics development lab, perform aging and longevity assessments on prototypes to validate design robustness. - During device burn-in testing for reliability, use these sockets to stress low to high power devices before final integration or shipment.